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Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.

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The most precise estimate of the area fractions occupied by each grain size will be obtained by evaluating the entire surface of that specimen. The area fraction occupied by the coarse grain was calculated from the corresponding values, as All required measurements are displayed in the “Current Field Results” box.

Use one of the procedures from 8. On the overlay, also mark the outline of the total eld of view the limits of the image. Arbitrary Division 1 2 1 1 1 1 Coarse Grain Size no.

The percent of the total intercept length represented by the intercept r1181 in each class interval was then calculated by dividing each value in the seventh column by the total intercept length For instance, banding present in a given specimen may not be easily recognizable in a transverse orientation. The grain size and area fraction values shown in a given report format correspond to the appearance of the w1181 shown. Count the number of grid points falling within the particular grain size region being evaluated.


The entire macroetched cross-section should be used as a basis for estimating area fractions occupied by distinct grain sizes, if possible. No other units of measurement are included in this standard.

For the ne grain, the total intercept length In this example, the results would be reported as: If the calculations are error-free, the eighth column should total to Results will be incorporated here when available.

For all other products, area fraction estimates should be equally accurate with either specimen orientation.

ASTM E – 02() – Standard Test Methods for Characterizing Duplex Grain Sizes

The distribution of intercept lengths is much more efficiently determined using a semi-automated image analysis system with a digitizing tablet and electronic pencil or cursor, or using an automated image analysis system with electronic pencil or cursor.

An example photomicrograph of the banding condition appears in Fig. The regions occupied by a distinct grain size are manually outlined on a photomicrograph or transparent overlay.

For instance, in Table X2. The software provides fast and accurate detection of grain boundaries or grain face areas. These procedures will be more difficult to apply than the Comparison Procedure of E, but will offer greater precision.

The Measuring and Referee Procedures are more difficult to apply, but offer greater accuracy. The entire macroetched cross-section should be used as a basis for estimating area fractions occupied by distinct grain sizes, if possible. Accordingly, the layer depth of 1.

If duplex grain size is suspected in a product too large f1181 be polished and etched as a single specimen, macroetching should be considered as a first step in evaluation. For the ne grain size, the number of intercepts totaled Apply this procedure to projected images from a microscope, or to photomicrographs. If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well.


E — 02 The test methods provide for reporting of specic, distinctive information for each type of duplex grain size.

Begin by outlining the distinct grain size regions in a given image, either on a transparent overlay placed over the projected image, or directly on a photomicrograph. These are available from microscope manufacturers. This standard does not purport to address all of the safety concerns associated with its use. However, those grain size and area fraction values are determined by examination of the entire area of the specimen, not by examination only of the eld e118 in the photomicrograph.

Grain Size Control Panel: The values from this calculation were entered in the seventh column of Table X2.

MSQ ASTM Grain Size Calculation, Grain Size Measurement

An additional button, “Duplex”, is found at the bottom of the control panel. An example of that bimodal ferrite grain size is shown in Fig. Of these, the Comparison Procedure is the simplest, but offers the least precision.